Production and quality of worldwide most demanding crop, wheat (triticum aestivum) is getting adversely effected day by day by many biotic and abiotic stressors. One of the most devastating and alarming stressor among them is strip rust caused by Puccinia striiformis f. sp. tritici (Pst). Developing resistant lines by gene pyramiding is considered an inexpensive and effective approach to overcome the loss caused by stripe rust. There are many stripe rust resistant genes reported till now, but most of them have lost their effectiveness due to emergence of new virulent strains of fungi (puccinia), but few of these genes are still resistant to current epidemic of puccinia races. Present studies was conducted to pyramid maximum stripe rust resistant genes (Yr5, Yr10, Yr15, Yr18, Yr26) in single line. Six parent for three different crosses (A, B, C) were identified by using marker assisted selection and evaluated under natural infection pressure by Pst races. F2 and F3 segregated populations were screened by MAS. Results revealed that the pyramiding effective or partially effective Yr genes significantly showed least coefficient of infection for stripe rust due to additive effects. Pyramided resistant F3 lines C1L2P9, C2L2P8 and C3L1P10 are highly recommended to further crossed with each other as four way cross in order to accumulate all five resistant genes in single plant for better development.

Keyword: wheat, triticum aestivum, gene pyramiding, stripe rust, MAS